Coated layer thickness Range less than 30 µm : Externally connected Both PC / Laptop (Windows 7)
35 Kg : 450 x 400 x 350 mm
0 ~ 50 Kv / 0 ~ 1 MA : Mo Material X-ray light tube with Triple Cooling technology - Oil, Air Cooling and Spl Heat Sink
HDSP technology (Hybrid Digital Signal Processor) for Faster Processing and higher stability : AU AG PT PD RH RU CU ZN NI CD IN OS IR W (from AL to U, around 79 elements)
Mo Material X-ray light tube with Triple Cooling technology - Oil, Air Cooling & Spl Heat Sink : Coated layer thickness Range less than 30 µm
670 x 400 x 300 mm : Eight fans of the circulatory system, Temperature control system can protect themselves
Most optimum size < 2mm : 1mm ~ 3mm
Externally connected Both PC / Laptop (Windows 7) : 30 Kg
1% - 99.99% : 30 ~ 100 Secs (User selectable)
0.1 ~ 0.2% (Accuracy can be influenced by environmental conditions & sample complexity) : Inbuilt touch screen PC makes it an unbeatable choice. Testing gold samples was never this easy
120 W : 0 ~ 50 Kv / 0 ~ 1 MA
AU AG PT PD RH RU CU ZN NI CD IN OS IR W (from AL to U, around 79 elements) : Si-Pin Diode Detector with Semi conductor cooling
MXGT Aurum is an inbuilt version of MXGT Aura. It adds to the convenience of operating the instrument through an Industrial standard touch screen with HD Display. It can be your best choice, if you're looking for reliable results, Results that are...
MXGT Aura can be your best choice, if you're looking for reliable results, Results that are par with Fire assay standards. Its advanced Si Pin Diode detector ensures highly stable performance. Its industry leading technology makes no mistake in...
Rapid Testing Speed Results - 30 ~ 40 Secs Compact Design with Inbuilt Touch Screen High Resolution Gas Proportional Counter Technology Ideal for Jewellers, Old Gold Purchase, Bank, Jewel Loans...
Intended Use : Energy Dispersive X-ray measuring instrument (EDXRF) for analysis of precious metals and their alloys in composition and coating thickness.
Intended Use : Energy Dispersive X-ray measuring instrument (EDXRF) for analysis of precious metals and their alloys in composition and coating thickness.
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