Listing ID #3900646
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Contact SupplierThe Beethor X3G uses X-Ray Fluorescence (XRF) for a quick and completely non-destructive method of testing for lead free manufacturing, RoHS compliance and the detection of heavy metals in toys and consumer products. The Beethor X3G provides rapid and accurate analysis on restricted materials such as lead (Pb), mercury (Hg), chrome (Cr), bromine (Br), and cadmium (Cd) at part per million levels.The Beeth or X3G uses X-Ray Fluorescence (XRF) for a quick and completely non-destructive method of testing for lead-free manufacturing, RoHS compliance and the detection of heavy metals in toys and consumer products. The Beeth or X3G provides rapid and accurate analysis on restricted materials such as lead (Pb), mercury (Hg), chrome (Cr), bromine (Br), and cadmium (Cd) at part per million levels.
The key to the success of the Beeth or X3G portable XRF analyzer is Silicon Drift Detector (SDD) technology, which offers count rates and resolution far superior to alternative SiPIN detector technology. The large solid angle and the high count rate capability of the industry-leading XFlash® SDD allows the user to take full advantage of the fluorescent radiation emitted from the sample, resulting in very short measurement times.
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