ADVANCED FALLING DART IMPACT TESTER

Utilizing on-board microprocessor technology, the Ray-Ran Microprocessor Controlled Falling Dart Impact Tester has taken falling dart testing machines to an advanced level at an affordable price. Built with operator simplicity in mind, its ease of operation and high accuracy makes it ideal for product development and quality control within production, research and development labs and teaching institutions.

Complying with the ASTM D 1709 Method A & B.

TECHNICAL SPECIFICATION:

·         Advanced dedicated microprocessor control,

·         Touch membrane Alpha / Numeric keypad

·         Easy to read liquid crystal display,

·         Sequence logic menu auto prompt selection

·         RS232 interface connector

·         Ethernet Interface connector for LAN Networking

·         Self-calibration procedure.

·         Photo electric cell technology

·         Variable drop height adjustment as standard 660mm – 1500mm

·         Pneumatic clamping system

·         Constant sample tension for repeatability

·         Solenoid actuated dart release mechanism with audible pre-warning

·         Dart return shoot

·         38.1mm (1 ½”) and 50.8mm (2”) spherical darts as standard

·         Binary weight set supplied as standard

·         Electrical interlock safety guard

·         Tabular and graphical statistical analysis

·         Techni-Test PC software

·         Product User Manual

·         CE declaration certificate

·         Traceable Calibration Certificate