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    C HiTESTER 3504-50

    C HiTESTER 3504-50

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    • Series3504-50
    • Supply TypeManufacturer, Exporter, Supplier
    • Preferred Buyer Location All over the world

    C HiTESTER 3504-50 C, D (tan δ), Q testing Measure high capacitance MLCC BIN function Testing source frequency: 120Hz or 1kHz Measuring time: 2msec RS-232C, GP-IB
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    Company Information

    simhan sdn bhd
    location Malaysia
    View Number
    • calendar Member Since 13 Years
    • building Nature of Business Supplier

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