- Series3504-60
- Supply TypeManufacturer, Exporter, Supplier
- Preferred Buyer Location All over the world
C HiTESTER 3504-60 C, D (tan δ), Q testing Measure high capacitance MLCC BIN function Contact check function Testing source frequency: 120Hz or 1kHz Measuring time: 2msec RS-232C, GP-IB