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Contact SupplierEnergy Gap In GE Crystal 4 Probe Method:
The Four Probe Method is one of the standard and most widely used methods for the measurement of resistivity of semi-conductors. The error due to contact resistance, which is specially serious in the electrical measurement on semi-conductors, is avoided by the use of two extra contacts (probes) between the current contacts. As long as the resistance of the crystal and contact resistances are small compared with the effective resistance of the voltage measuring device (potentiometer, electrometer or electronic voltmeter), the measured value will remain unaffected. Because of pressure contacts, the arrangement is also specially useful for quick measurement on different crustals or sampling different parts of the crystal.