Ingot Lifetime Scanning Machine

The LL 156/300 is designed to evaluate material quality quickly and economically. This handy machine helps to guarantee a steady quality of wafers   Detailed Specs – Mapping of carrier lifetime, photoconductivity, resistivity – Non-contact, non-destructive electrical semiconductor characterisation – Two dimensional ingot mapping system for solar grade multi silicon – Measurement time: 2 minutes for two surfaces simultaneously – One ingot four sides with handling: 5 – 6 min – Resolution 1 mm