- Brand NameDCS Certification
- ApplicationLicense
- Country of OriginIndia
- Business TypeService Provider
- Preferred Buyer Location All over the world
ISO 17901-2:2015 specifies the terms and measurement method concerning exposure characteristics (exposure characteristic curve, exposure at half-maximum, R-value, amplitude of refractive index modulation) for the hologram recorded by double-beam interference. The materials of hologram to be measured are not restricted to any particular ones. ISO 17901-2:2015 does not intend to restrict manufacturing process.