Quattro Scanning Electron Microscope

The Quattro scanning electron microscope (SEM) is a versatile, high-performance instrument with a field emission gun (FEG) for excellent resolution and beam current stability.
Three vacuum modes (high vacuum, low vacuum, and ESEM) provide the flexibility to accommodate the widest range of samples of any SEM available, including samples that are outgassing or otherwise not vacuum-compatible. Quattro offers a choice of detectors that include directional backscatter information, STEM and cathodoluminescence for tunable and real color contrast. All Quattro ESEM systems can be equipped with analytical capabilities, such as energy dispersive x-ray spectroscopy (EDS), wavelength dispersive x-ray spectroscopy (WDS) and electron backscatter diffraction (EBSD) coplanar with EDS.
Quattro’s unique architecture is supported by a help function (User Guidance) that not only instructs, but also directly interacts with the microscope. Quattro supports undoredo functionality, scanning presets, column presets, easy camera-based navigation, SmartSCAN™ and drift compensated frame integration (DCFI) to boost productivity, data quality and ease of use.