Reduced optical error measurement caused by dust and contaminants, High response, 2 to 15ms, Significantly effective for distinctive applications:Ceramic high-temp. baking process　- Crystal growing, Main Specifications, Temperature range: 350 to 2000ºC 400 to 3100ºC 500 to 3500ºC Response time: 2 to 15ms, Analog output: 4 to 20mADC.

Reduced optical error measurement caused by dust and contaminants, High response, 2 to 15ms, Significantly effective for distinctive applications:Ceramic high-temp. baking process　- Crystal growing, Main Specifications, Temperature range: 350 to 2000ºC 400 to 3100ºC 500 to 3500ºC Response time: 2 to 15ms, Analog output: 4 to 20mADC.