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Contact SupplierScanning Ion Conductance Microscopy (SICM) isa technique for mapping the nano-scale topography of soft and delicate surfaces. It provides powerful multi-channel capability in a single instrument. Scanning Electrochemical Microscopy (SECM)-SICM , optical and confocal-SICM, and targeted patch clamping-SICM are some of the operating configurations available.
Scanning ion conductance microscopy (SICM) in topography imaging tool can be used for ion channel event recording, mechanical stimulation, simultaneous ion current and electrochemical current recording, localized delivery, single cell sampling and transport studies.