X-ray Fluorescence Spectrometer

Sequential X-Ray Fluorescence Spectrometer
The XRF-1800 provides local analysis and 250µm mapping capabilities as standard features, enabling reliable analysis of a local area, only a 0.5mm in diameter in the wavelength dispersive method. More
than a 30% sensitivity improvement compared with a conventional 3kW X-ray tube is achieved through the use of a 4kW X-ray tube with a thin window.
• Elements to be determined :
• 8O ˜ 92U with LiF, PET, Ge and TAP analyzing crystal
• 4Be ˜ 7N with optional analyzing crystal
• X-ray tube: 4kW with a thin window
• 5011m Mapping resolution as standard