X-Ray General Purpose Diffractometer 3700 Series

X-ray diffraction is the dactyloscopy in material science , a reliable non-destructive technique of identification of crystalline matter.

• Horizontal two-circle 2θ-θ goniometer.
• High reliability and user-friendly operation.
• Flexible design and wide range of options.
• high automation for setting and measurements. 

Basic comfiguration :

• Protective cabinet.
• Two-circle goniometer.
• High voltage power supply.
• Sealed X-ray tube in a protective housing.
• Electronic control unit.
• Scintillation Nal (TI)detector.
• Sample holder with rotation.
• Collimation system.
• Beta-filter for Cu-radiation.
• Standard powder sample of quartz.
• DataCol software for control and data collection.
• Accessories and spare parts.

Advance Option :

• X-ray registration system base on linear position –sensitive stripped detector.
• High-temperature oven –chamber (uo to 1200°C).
• One-dimensional parabolic mirror for parallel beam geometry.
• Attachment for texture and stress analyses, and for determination of crystal orientation.
• Peltier-cooled energy-dispersive solid state Si (Li) detector.
• Unear position-sensitive stripped detector.
• Flexible monochromator holders for primary and diffracted beams.
• Crystals-monochromators of different types.
• Rigid holder for bulk samples.
• Holder for Cylindrical samples (capillaries).
• Housing for foreign sealed X-ray tubes.
• Sealed X-ray tubes with various focus sizes and target materials.
• ß-fihers for different radiations.
• Closed cooling systems for X-ray tube.
• Sample carriers (cuvetts).