PC Based Double Beam, Automatic source optimisation, Base line calibration & Cell optimisation, Single Wavelength, Multi Wavelength, Scan (with multi scan facility), Time Scan, Kinetic scan operating modes, Automatic 5 position sample changer,...
Micro controller based, stand alone unit, Automatic source optimisation, Single Multi wavelength and Spectrum Time Scan operating modes, Date processing (through optional PC) Peak-pick, Point-pick, Expansion Overlaying Averaging Subtraction 1st to...
Features : 128 x 64 Dot Graphical LCD,Auto Wavelength Setting,Tungsten/Deuterium Lamp can be turned ON/OFF Individually to Extend Lifetime,Application Software provides complete control of the instrument from a computer through the built-in USB Port,Pre-aligned desi
Enables measurement of reflecting colours (d/8) equipped With simultaneous measurement of SCI/SCE. Conforms to CIE No. 15, ISO7724/1 ASTM1164, DIN5033 Teil andJIS Z8722 Condition C standard. Transmittance d/0 conforms To CIE No.15, ASTM1164 and...
USED FOR CHECKING L, A, B VALUE, Accurately measure reflective or uneven surfaces on a wide variety of products and packaging types. Ensure a color quality audit trail across multiple devices and locations for consistent color and brand integrity in...
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