Fischer Measurement Technologies (India) Pvt. Ltd.

Hinjewadi, Pune, Maharashtra

FISCHERSCOPE X-RAY XDL X-ray fluorescence measuring device for manual as well as automated coating thickness measurements on decorative and protective coatings. They are universally applicable energy dispersive X-ray measuring instruments used for non-destructive thickness measurements as well as analysis of thin coatings for the measurements on mass-produced parts as well as printed circuit boards. FISCHERSCOPE X-RAY XDL is designed under the direction of practiced quality controllers following the international industrial standards. 

Models

• XDL 210: Plane support stage, fixed Z-axis

• XDL 220: Plane support stage, motor-driven Z-axis

• XDL 230: Manually operable XY-stage, motor-driven Z-axis

• XDL 240: Motor-driven XY-stage that moves into the loading position automatically, when the protective hood is opened. Motor-driven programmable Z-axis

Applications

• Measurement of electroplated mass-produced parts

• Study of thin coatings like decorative chromium-plating

• Examination of functional coatings in the electronics as well as semiconductor industries

• Automated measurements such as printed circuit boards

• Solution study in the electroplating

The instrument of Electroplating Thickness ensures quick and exact materials analysis with user-friendly features. The array is ideal for the analysis of varied precious metal as well as gold alloys. The collection comes with geometric arrangement of hardware components. X-ray source as well as detector is situated below the measurement chamber and the measurement is conducted from bottom to top for easy & swift positioning of the samples. The range comes in varied versions only differ in terms of detectors, number of apertures, X-ray tubes, and filters.

Features

• X-ray tube with W-anode as well as glass window or micro-focus X-ray tube having W-anode and beryllium window.
• Maximum operating conditions: 50 kV, 50W
• Proportional counter tube, Silicon drift detector as X-ray detector or silicon PIN diode
• Aperture: fixed or 4-x automatically exchangeable,   0.2 mm to  2 mm
• Primary filter: fixed, 3-x exchangeable or 6-x automatically exchangeable
• Fixed sample support
• Video camera for optical observations of the measurement position along the axis of the primary X-ray beam. Crosshairs with calibrated scale (ruler) as well as display of the measurement spot Design-approved, completely protected instrument compliant with the German X-ray ordinance.

Applications

• Gold as well as precious metal study in the Jewellery and watch industries
• Measurement of thin coatings of few nanometers like Au and Pd on the printed circuit boards as well as electronics components
• Trace study (e.g. harmful substances in electronic components (ROHS) or tools)
• Examination of light elements like Al, Si, P with the XAN 250
• General materials analysis as well as coating thickness measurement in testing institutions, laboratories and universities