Fischer Measurement Technologies (India) Pvt. Ltd.

Hinjewadi, Pune, Maharashtra

The high-end measurement system Fischerscope X-Ray XAN SDD was developed specifically for non destructive, high precision analysis of thin gold and precious metal coatings. Gold testing machine in hallmarking centres: XDV-SDD is engineered under the firm direction of expert quality controllers. These are basically X-ray fluorescence measuring instrument with a programmable XY-stage and Z-Axis for Automated Measurements of very thin coatings and for trace analysis. These are extensively used as an energy-dispersive X-ray fluorescence measuring instrument for the measurement and analysis of very thin coatings or small concentrations in the trace analysis.

Design

• These are universally applicable energy-dispersive X-ray fluorescence measuring instrument widely used for measuring and analyzing very thin coatings or small concentrations in the trace analysis.
• These have programmable XY-stage, which make these perfect for auto-mated sample measurements.
• These are featured with electrically changeable apertures and primary filters and modern silicon drift detector to ensure high accuracy, good detection sensitivity, long term stability and outstanding accuracy.
• These are widely recommended by clients owing to its precise design, robust design, longer service life and effective usage.
• These are user-friendly bench-top instrument equipped with programmable XY-stage and an electrically driven Z-axis for automatic measurement.
• These are also fitted with a laser pointer, integrated video-microscope with zoom, protective hood and cross-Hairs simplifies sample placement for perfect measurement.
• These are operated using the powerful and user-friendly WinFTM® software, for entire operation and evaluation of measurements as well as the clear presentation of measurement data is performed on a PC.

Typical areas of application are

• Analysis of very thin coatings, e.g. gold/palladium coatings of ⤠0.1 μm
• Trace analysis on pc boards according to ROHS and WEEE requirements
• Gold analysis
• Measurement of functional coatings in the electronics and semiconductor industries
• Determination of complex multi-coating systems
• Automated measurements, e.g., in quality control

Coating thickness measurement for PCB using XDLM PCB 210 is a qualitative range of devices available in various technical specifications. These are extensively acknowledged as specific X-ray fluorescence measuring instruments for measurements and analyses of coating thicknesses and compositions on printed circuit boards. These are acclaimed for its longer service life and outstanding accuracy.

Applications

• Measurements on small components and structures on printed circuit boards in sizes up to 610 x 610 mm (24 x 24 in)
• Measurements of functional coatings in the electronics and semiconductor industries
• XDLM-PCB 210 and 220: Automated measurements, e.g., in quality control
• Determining the composition of electroplating baths

General Specification

• Intended use: Energy dispersive x-ray fluorescence measuring instrument (EDXRF) to determine thin coatings, small structures and alloys.
• Element range: Chlorine (17) to Uranium U (92)  up to 24 elements simultaneously.
• Design: Bench-top unit with housing with a slot on the side
• Measuring direction: Top down

X-ray fluorescence for coating thickness measurement and material analysis

Whether for coating thickness measurement or material analysis, Fischer is your partner of choice for precise and absolutely reliable measurement technology. With our X-ray systems, we offer highly efficient solutions to make your work as easy as possible.

XRF coating thickness measurement is used for measuring metallic coating and multilayer coating thickness measurement.

The high-end measurement system Fischerscope X-Ray XAN SDD was developed specifically for non destructive, high precision analysis of thin gold and precious metal coatings. These are basically X-ray fluorescence measuring instrument with a programmable XY-stage and Z-Axis for Automated Measurements of very thin coatings and for trace analysis. These are extensively used as an energy-dispersive X-ray fluorescence measuring instrument for the measurement and analysis of very thin coatings or small concentrations in the trace analysis.

Design

• These are universally applicable energy-dispersive X-ray fluorescence measuring instrument widely used for measuring and analyzing very thin coatings or small concentrations in the trace analysis.
• These have programmable XY-stage, which make these perfect for auto-mated sample measurements.
• These are featured with electrically changeable apertures and primary filters and modern silicon drift detector to ensure high accuracy, good detection sensitivity, long term stability and outstanding accuracy.
• These are widely recommended by clients owing to its precise design, robust design, longer service life and effective usage.
• These are user-friendly bench-top instrument equipped with programmable XY-stage and an electrically driven Z-axis for automatic measurement.
• These are also fitted with a laser pointer, integrated video-microscope with zoom, protective hood and cross-Hairs simplifies sample placement for perfect measurement.
• These are operated using the powerful and user-friendly WinFTM software, for entire operation and evaluation of measurements as well as the clear presentation of measurement data is performed on a PC.

Typical areas of application are

• Analysis of very thin coatings, e.g. gold/palladium coatings of  0.1 m
• Trace analysis on pc boards according to ROHS and WEEE requirements
• Gold analysis
• Measurement of functional coatings in the electronics and semiconductor industries
• Determination of complex multi-coating systems
• Automated measurements, e.g., in quality control