Digital Coating Thickness Gauge

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Measurement acquisition via surface area measurement: Individual readings are captured continually until the probe is lifted, at which point a mean value is generatedMeasurement with
Factory Diagnosis Diagram (FDD®) for visualising process qualityPrint form generation
Extensive evaluation and statistics functions with supporting graphical presentation optionsWide selection of high-precision probes including many specialised probes for even the most sophisticated measurement applications
Automatic probe and substrate material recognitionAveraging of measurement data: Only the mean value of multiple readings is stored
Supply TypeManufacturer, Exporter, Supplier, Retailer
Preferred Buyer Location All over the world

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FISCHER MEASUREMENT TECHNOLOGIES (INDIA) PVT. LTD.

Shivaji Marg, Delhi

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Member Since 13 Years
Nature of Business Retailer
Year of Establishment 2006

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Graphical representation as histogram or sum frequency chartInput option for process tolerance limits and calculation of the associated process capability indices cp and cpk
Factory Diagnosis Diagram (FDD®) for visualising process qualityPrint form generation
Memory adequate for thousands of measuring applications and several thousand readingsUSB communication and printer port
Measurement acquisition via surface area measurement: Individual readings are captured continually until the probe is lifted, at which point a mean value is generatedMeasurement with
Very simple calibration via operator guidanceClear management of measuring applications through user-definable file and folder structure
Windows™ CE operating system with large touchscreen displayIndividually customizaable user interface
Extensive evaluation and statistics functions with supporting graphical presentation optionsWide selection of high-precision probes including many specialised probes for even the most sophisticated measurement applications
Can be set to various European and Asian languagesVarious display screens for measurement acquisition, e.g. with concurrent
Automatic probe and substrate material recognitionAveraging of measurement data: Only the mean value of multiple readings is stored
Display of important statistical characteristics such as mean value, standard deviation, min, max, and rangeStatistics of the most important characteristics displayed in block and final results, analysis of variance (ANOVA) values
Outlier rejection function for the automatic elimination of erroneous measurementsMatrix measurement mode for interrelated multipoint measurements

Dualscope fmp100 uses both the magnetic induction method (din en iso 2178) and the eddy current method (din en iso 2360). It can measure the following coating substrate systems:
• non ferromagnetic coatings on ferromagnetic base metal like iron and steel.
• insulated coatings on ferromagnetic base metal like iron and steel
• insulated coatings on non-ferromagnetic base metal like aluminum, zinc etc
• duplex coatings (paint hot-dip galvanized coatings)
on steel (heavy duty corrosion protection), whereby paint and zinc coatings are measured simultaneously and displayed separately.
In addition to the above, the dualscope fmp150 is also able to employ the magnetic method (din en iso 2178), which offers further measurement options:
• thick, non-magnetic but conductive coatings on iron and steel
• nickel coatings on nonferrous heavy metals therefore, the fmp150 is especially well suited for measurements on print drums, where the chrome and copper coatings are measured in one step but displayed separately.