Description :-
Burn-in test equipment is also known as life testing equipment and is largely used in semiconductor industry for testing the quality of an integrated circuit, application-specific integrated circu its, printed circuit board and other microprocessors. The equipment sometimes makes use of specific machines to test memory modules, linear components such as voltage regulators, logic modules, mixed signal components such as analog switches and multiplexers, and discrete components such as diodes and transistors.
Salient Features:

• The equipment uses raised voltages, temperatures and power cycling to evaluate high power chips, boards or products.
• The equipment consist of ovens that typically operate between -55o and 150oC.
• Provided with a power supply for applying a predetermined power supply voltage through a higher level power supply line and a lower level power supply line.
• The equipment stimulate any potential failures in substandard products, known as the “infant mortality” of a device in the semiconductor industry.

Description :-
Burn-in test equipment is also known as life testing equipment and is largely used in semiconductor industry for testing the quality of an integrated circuit, application-specific integrated circu its, printed circuit board and other microprocessors. The equipment sometimes makes use of specific machines to test memory modules, linear components such as voltage regulators, logic modules, mixed signal components such as analog switches and multiplexers, and discrete components such as diodes and transistors.
Salient Features:

• The equipment uses raised voltages, temperatures and power cycling to evaluate high power chips, boards or products.
• The equipment consist of ovens that typically operate between -55o and 150oC.
• Provided with a power supply for applying a predetermined power supply voltage through a higher level power supply line and a lower level power supply line.
• The equipment stimulate any potential failures in substandard products, known as the “infant mortality” of a device in the semiconductor industry.