Our Product / Services
Our product range contains a wide range of Hardness Tester, Electronics Component Tester and Digital IC Tester
ROCKWELL ROCKWELL CUM BRINELL SUPERFICIAL SUPERFICIAL CUM ROCKWELL SUPERFICIAL CUM ROCKWELL CUM BRINELL Precision fully enclosed seasoned cast iron body hardness tester ideally suitable for use on measuring hardness of metals and altoys of all types soft or hard in any shape whether flat, round, or irregular shapes equipped with special clampingl cone for holding job to avoid slipage to protect indentors. Dial gauge is covered with transparent glass cover to protect from dust and damages loading is by square threaded screw and unloading is by eccentric lever while penetration is hydraulically operated. Maximum depth of threat 150 mm.
MODEL
| TEST HEIGHT | DEPTH OF THROAT | SIZE | |
| MM | MM | MM X MM X MM | |
| L W H | |||
| STANDARD | 250+/-5 | 150+/-5 | 455 x 170 x 670 |
| MEDIUM | 350+/-5 | 150+/-5 | 455 x 170 x 830 |
| JUMBO | 550+/-5 | 150+/-5 | 515 x 205 x 1020 |
| PRINCIPLE | LOAD K f. | SCALE | RECOMMENDED FOR |
| Rockwell | 60,100,150 | A, B, C, | Case Hardened Steel, Annealed Ferrous & Nonferrous Materials, Hardened & Temered Materials. |
| Rockwell Cum | 60,100,150 | A,.9, C, | Annealed Steel & Cast Iron, Nonterrous |
| Brinell | 187.5,250 | HB | Metal & Alios. |
| Super Fical | 15,30,45 | N, T | Thin Section of Hardened Tool Steel, Case Hardened Steel, Heat Treated Spring Steel, Soft Annealed Ferrous & Nonferrous Materiais. |
| Superfical Cum | 15,30,45 | N, T | Rockwell 8 Superficial Principle. |
| Rockwell | 60,100,150 | A, 8, C, | |
| Superfical Cum | 15,30,45 | N. T | Rockwell, Brinell & Superficial Principle. |
| Rockwell Cum | 60,100,150 | A, B, C, | |
| Brinell | 187.5,250 | HB |
It is the latest microcontroller based electronic components functional tester. It functionally tests avariety of electronic active components and linear ICs including diodes, zener diode, transistor, SCR, UJT, FET operational amplifiers, comparators, transistor arrays, optocouplers, analog switches, multiplexers, voltage followers, Ato Dconverters, Dto Aconverters, timers, VCO, PLL, waveform generators, voltage regulators, seven segment displays, relays & other selected special function analog ICS. No personality cards/reference IC/IC data required. Automatic testing of IC after entering the IC number. No wiring is required. Continuous mode of testing ICs until aborted. Number of times the test was successful is displayed. Step mode to locate the faulty pin. Step number and faulty pin number are displayed. Backspace clear select option and number keys for editing IC number. Remembers the IC number for repeated testing of same IC. Self test facility during power-on and through keyboard. Help key for short description of the various key function. Potential free 20 pin ZIF (Zero Insertion Force) socket for easy insertion and removal of ICs under test and component holder to hold components. Computer Interface through for enhancement of IC test library Buzzer to indicate bad IC.
It is the latest microprocessors based Digital IC Testers. It functionally tests avariety of digital ICs including microprocessors, peripheral ICs, EPROMs, RAMs, etc., apart from the standard 74 & 54 series of TTL Ics and 40 & 45 series of CMOS ICs. Features No. personality cards /reference IC/IC data required. Automatic testing of ICs at 4.75V & 5.25V to locate marginally bad ICs. Continuous mode for testing ICs until Aborted. Number of times the test was successful if displayed. Step mode to locate faulty pin through discrete LEDs for find the number of unknown good digital IC with facility to locate its functional equivalents for ICs upto 20 pins Memory test for EPROM indicates non blank location address with data content. For RAMs bad location address is displayed. Buzzer to indicate bad IC, Separate field for display of mode of operation (ONE/CON/STP) Current drawn is displayed in sseparate field for Good ICs. Backspace, clear and double digit entry keys for editing IC number Remembers IC Numbers for repeated testing of same IC. SELFTEST facility during power ON and through keyboard Potential free 20 pin and 40 pin ZIF (zero insertion force) Protection against wrong insertion of IC under test.
Rakesh Mittal (Elab Engineering)
F-197/A, ALPHA-2 GREATER NOIDA Gautam Budh Nagar, Uttar Pradesh - 201308, India
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